Publicaciones en las que colabora con Eduardo Elizalde Pérez-Grueso (19)

2006

  1. Electron inelastic mean free path and dielectric properties of a -boron, a -carbon, and their nitrides as determined by quantitative analysis of reflection electron energy loss spectroscopy

    Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 24, Núm. 3, pp. 396-407

2004

  1. Quantitative REELS of amorphous carbon and carbon nitride films

    Surface and Interface Analysis

2002

  1. Factor analysis applied to the study of valence band resonant photoemission spectra in transition-metal compounds

    Surface and Interface Analysis

  2. Friction mechanisms of amorphous carbon nitride films under variable environments: A triboscopic study

    Surface and Coatings Technology, Vol. 160, Núm. 2-3, pp. 138-144

2001

  1. Resonant photoemission of TiN films

    Physical Review B - Condensed Matter and Materials Physics, Vol. 63, Núm. 7

2000

  1. BN and ZrN AES Spectra Obtained by Depth Profiling of ZrN/BN Multilayers

    Surface Science Spectra, Vol. 7, Núm. 2, pp. 86-92

  2. Bonding and morphology study of carbon nitride films obtained by dual ion beam sputtering

    Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 18, Núm. 2, pp. 515-523

  3. Correlation between N1 s core level x-ray photoelectron and x-ray absorption spectra of amorphous carbon nitride films

    Applied Physics Letters, Vol. 77, Núm. 6, pp. 803-805

  4. Correlation between bonding structure and mechanical properties of amorphous carbon nitride thin films

    Surface and Coatings Technology

  5. Determination of resputtering yields in carbon nitride films grown by dual ion beam sputtering

    Surface and Coatings Technology, Vol. 125, Núm. 1-3, pp. 366-370

  6. Friction measurements of CNx and TiCxNy films by scanning force microscopy

    Surface and Interface Analysis, Vol. 30, Núm. 1, pp. 638-642

1999

  1. Dielectric properties of Ti, TiO2 and TiN from 1.5 to 60 eV determined by reflection electron energy loss spectroscopy (REELS) and ellipsometry

    Physica Status Solidi (A) Applied Research, Vol. 175, Núm. 1, pp. 429-436

  2. The role of CN chemical bonding on the tribological behaviour of CNx coatings

    Surface and Coatings Technology, Vol. 120-121, pp. 594-600

  3. Tribological and chemical characterization of ion beam-deposited CNx films

    Vacuum, Vol. 52, Núm. 1-2, pp. 199-202

1998

  1. Quantitative chemical depth profiles of ZrN/BN multilayers

    Surface and Interface Analysis, Vol. 26, Núm. 11, pp. 806-814

1997

  1. Carbon nitride films synthesized by dual ion beam sputtering

    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 122, Núm. 3, pp. 534-537

1996

  1. Thin BN films obtained by dual-ion-beam sputtering: An FT-IR and spectroscopic ellipsometry characterization

    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 112, Núm. 1-4, pp. 275-279

  2. Zr-BN multilayers obtained by ion-assisted sputtering: An FT-IR, GAXRD and AES depth profiling characterization

    Surface and Coatings Technology, Vol. 84, Núm. 1-3, pp. 392-397

1994

  1. Characterization of Zr thin films grown by dual ion-beam sputtering

    Vacuum, Vol. 45, Núm. 10-11, pp. 1039-1041