GRUPO DE NANOCIENCIA
UONANO
José María
Sanz
Publicaciones en las que colabora con José María Sanz (26)
2006
-
Electron inelastic mean free path and dielectric properties of a -boron, a -carbon, and their nitrides as determined by quantitative analysis of reflection electron energy loss spectroscopy
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 24, Núm. 3, pp. 396-407
2004
-
Quantitative REELS of amorphous carbon and carbon nitride films
Surface and Interface Analysis
2002
2001
-
Electronic interaction at the TiO2-Al2O3 interface as observed by X-ray absorption spectroscopy
Surface Science
-
Resonant photoemission and X-ray absorption study of electronic structure of the TiO2-Al2O3 interface
Langmuir, Vol. 17, Núm. 23, pp. 7339-7343
-
Resonant photoemission of TiN films
Physical Review B - Condensed Matter and Materials Physics, Vol. 63, Núm. 7
2000
-
BN and ZrN AES Spectra Obtained by Depth Profiling of ZrN/BN Multilayers
Surface Science Spectra, Vol. 7, Núm. 2, pp. 86-92
-
Bonding and morphology study of carbon nitride films obtained by dual ion beam sputtering
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 18, Núm. 2, pp. 515-523
-
Correlation between N1 s core level x-ray photoelectron and x-ray absorption spectra of amorphous carbon nitride films
Applied Physics Letters, Vol. 77, Núm. 6, pp. 803-805
-
Correlation between bonding structure and mechanical properties of amorphous carbon nitride thin films
Surface and Coatings Technology
-
Crystal-field effects at the TiO2-SiO2 interface as observed by X-ray absorption spectroscopy
Langmuir, Vol. 16, Núm. 17, pp. 7066-7069
-
Determination of resputtering yields in carbon nitride films grown by dual ion beam sputtering
Surface and Coatings Technology, Vol. 125, Núm. 1-3, pp. 366-370
-
Friction measurements of CNx and TiCxNy films by scanning force microscopy
Surface and Interface Analysis, Vol. 30, Núm. 1, pp. 638-642
1999
-
Combination of specular and off-specular low-angle X-ray diffraction in the study of Co/Cu multilayers: Mesoscopic structure and layer oxidation
Surface and Interface Analysis, Vol. 27, Núm. 1, pp. 1-7
-
Dielectric properties of Ti, TiO2 and TiN from 1.5 to 60 eV determined by reflection electron energy loss spectroscopy (REELS) and ellipsometry
Physica Status Solidi (A) Applied Research, Vol. 175, Núm. 1, pp. 429-436
-
Oxidation study of Co/Cu multilayers by resonant X-ray reflectivity
Vacuum, Vol. 52, Núm. 1-2, pp. 109-113
-
The role of CN chemical bonding on the tribological behaviour of CNx coatings
Surface and Coatings Technology, Vol. 120-121, pp. 594-600
-
Tribological and chemical characterization of ion beam-deposited CNx films
Vacuum, Vol. 52, Núm. 1-2, pp. 199-202
1998
-
Combination of specular and off-specular low-angle X-ray diffraction in the study of metallic multilayers
Solid State Communications, Vol. 108, Núm. 10, pp. 769-773