CARLOS
QUIROS FERNANDEZ
Catedrático de Universidad
Universidad Autónoma de Madrid
Madrid, EspañaPublicaciones en colaboración con investigadores/as de Universidad Autónoma de Madrid (33)
2018
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Crystalline Structure and Vacancy Ordering across a Surface Phase Transition in Sn/Cu(001)
Journal of Physical Chemistry B, Vol. 122, Núm. 2, pp. 745-756
2009
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Surface x-ray diffraction analysis using a genetic algorithm: The case of Sn/Cu(100)-(3√2 × √2)R45°
Journal of Physics Condensed Matter, Vol. 21, Núm. 13
2007
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Multiple-length-scale small-angle X-ray scattering analysis on maghemite nanocomposites
Journal of Applied Crystallography
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Structural and magnetic properties of CoxSi1-x thin films and multilayers
Journal of Physics Condensed Matter, Vol. 19, Núm. 48
2006
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Electron inelastic mean free path and dielectric properties of a -boron, a -carbon, and their nitrides as determined by quantitative analysis of reflection electron energy loss spectroscopy
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 24, Núm. 3, pp. 396-407
2005
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Fermi surface gapping and nesting in the surface phase transition of Sn/Cu(100)
Physical Review B - Condensed Matter and Materials Physics, Vol. 72, Núm. 4
2004
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Quantitative REELS of amorphous carbon and carbon nitride films
Surface and Interface Analysis
2002
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Electronic structure of TiO2 monolayers grown on Al2O3 and MgO studied by resonant photoemission spectroscopy
Surface Science
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Factor analysis applied to the study of valence band resonant photoemission spectra in transition-metal compounds
Surface and Interface Analysis
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Friction mechanisms of amorphous carbon nitride films under variable environments: A triboscopic study
Surface and Coatings Technology, Vol. 160, Núm. 2-3, pp. 138-144
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Magnetic anisotropy of ultrathin cobalt films on Pt(111) investigated with x-ray diffraction: Effect of atomic mixing at the interface
Physical Review B - Condensed Matter and Materials Physics, Vol. 65, Núm. 5, pp. 1-8
2001
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Electronic interaction at the TiO2-Al2O3 interface as observed by X-ray absorption spectroscopy
Surface Science
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Resonant photoemission and X-ray absorption study of electronic structure of the TiO2-Al2O3 interface
Langmuir, Vol. 17, Núm. 23, pp. 7339-7343
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Resonant photoemission of TiN films
Physical Review B - Condensed Matter and Materials Physics, Vol. 63, Núm. 7
2000
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BN and ZrN AES Spectra Obtained by Depth Profiling of ZrN/BN Multilayers
Surface Science Spectra, Vol. 7, Núm. 2, pp. 86-92
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Bonding and morphology study of carbon nitride films obtained by dual ion beam sputtering
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 18, Núm. 2, pp. 515-523
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Correlation between N1 s core level x-ray photoelectron and x-ray absorption spectra of amorphous carbon nitride films
Applied Physics Letters, Vol. 77, Núm. 6, pp. 803-805
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Correlation between bonding structure and mechanical properties of amorphous carbon nitride thin films
Surface and Coatings Technology
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Crystal-field effects at the TiO2-SiO2 interface as observed by X-ray absorption spectroscopy
Langmuir, Vol. 16, Núm. 17, pp. 7066-7069
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Determination of resputtering yields in carbon nitride films grown by dual ion beam sputtering
Surface and Coatings Technology, Vol. 125, Núm. 1-3, pp. 366-370