A long standoff profilometer for surface inspection in adverse environments based on Conoscopic holography

  1. Enguita, J.M.
  2. Álvarez, I.
  3. Fraga, C.
  4. Marina, J.
  5. Fernández, Y.
  6. Sirat, G.
Proceedings:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

Year of publication: 2005

Volume: 5856 PART I

Pages: 481-490

Type: Conference paper

DOI: 10.1117/12.612259 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus