A long standoff profilometer for surface inspection in adverse environments based on Conoscopic holography

  1. Enguita, J.M.
  2. Álvarez, I.
  3. Fraga, C.
  4. Marina, J.
  5. Fernández, Y.
  6. Sirat, G.
Aktak:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

Argitalpen urtea: 2005

Alea: 5856 PART I

Orrialdeak: 481-490

Mota: Biltzar ekarpena

DOI: 10.1117/12.612259 GOOGLE SCHOLAR
Datuen iturria: Scopus