A long standoff profilometer for surface inspection in adverse environments based on Conoscopic holography

  1. Enguita, J.M.
  2. Álvarez, I.
  3. Fraga, C.
  4. Marina, J.
  5. Fernández, Y.
  6. Sirat, G.
Actes de conférence:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

Année de publication: 2005

Volumen: 5856 PART I

Pages: 481-490

Type: Communication dans un congrès

DOI: 10.1117/12.612259 GOOGLE SCHOLAR
La source de données: Scopus