A long standoff profilometer for surface inspection in adverse environments based on Conoscopic holography

  1. Enguita, J.M.
  2. Álvarez, I.
  3. Fraga, C.
  4. Marina, J.
  5. Fernández, Y.
  6. Sirat, G.
Actas:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

Ano de publicación: 2005

Volume: 5856 PART I

Páxinas: 481-490

Tipo: Achega congreso

DOI: 10.1117/12.612259 GOOGLE SCHOLAR

Obxectivos de Desenvolvemento Sustentable

Fonte de datos: Scopus