Dielectric properties of Ti, TiO2 and TiN from 1.5 to 60 eV determined by reflection electron energy loss spectroscopy (REELS) and ellipsometry

1. Fuentes, G.G.
2. Mancheño, I.G.
3. Balbás, F.
4. Quirós, C.
5. Trigo, J.F.
6. Yubero, F.
7. Elizalde, E.
8. Sanz, J.M.