Dielectric properties of Ti, TiO2 and TiN from 1.5 to 60 eV determined by reflection electron energy loss spectroscopy (REELS) and ellipsometry

  1. Fuentes, G.G.
  2. Mancheño, I.G.
  3. Balbás, F.
  4. Quirós, C.
  5. Trigo, J.F.
  6. Yubero, F.
  7. Elizalde, E.
  8. Sanz, J.M.
Aldizkaria:
Physica Status Solidi (A) Applied Research

ISSN: 0031-8965

Argitalpen urtea: 1999

Alea: 175

Zenbakia: 1

Orrialdeak: 429-436

Mota: Artikulua

DOI: 10.1002/(SICI)1521-396X(199909)175:1<429::AID-PSSA429>3.0.CO;2-6 GOOGLE SCHOLAR

Garapen Iraunkorreko Helburuak

Datuen iturria: Scopus