Dielectric properties of Ti, TiO2 and TiN from 1.5 to 60 eV determined by reflection electron energy loss spectroscopy (REELS) and ellipsometry

  1. Fuentes, G.G.
  2. Mancheño, I.G.
  3. Balbás, F.
  4. Quirós, C.
  5. Trigo, J.F.
  6. Yubero, F.
  7. Elizalde, E.
  8. Sanz, J.M.
Journal:
Physica Status Solidi (A) Applied Research

ISSN: 0031-8965

Year of publication: 1999

Volume: 175

Issue: 1

Pages: 429-436

Type: Article

DOI: 10.1002/(SICI)1521-396X(199909)175:1<429::AID-PSSA429>3.0.CO;2-6 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus