Layer Contour Characterization in Additive Manufacturing Through Image Binarization

  1. D. Blanco
  2. A. Fernández
  3. P. Fernández
  4. B. Álvarez
  5. F. Peña
Libro:
Manufacturing Engineering Society International Conference, MESIC 9: Gijόn, 2021, Spain, June 23-24-25
  1. José Carlos Rico Fernández (ed. lit.)
  2. Eduardo Cuesta González (ed. lit.)
  3. Gonzalo Valiño Riestra (ed. lit.)
  4. Víctor Manuel Meana Díaz (ed. lit.)
  5. Pedro Fernández Álvares (ed. lit.)

Editorial: Manufacturing Engineering Society International

ISBN: 9788409292295

Año de publicación: 2021

Páginas: 110-110

Congreso: Manufacturing Engineering Society International Conference (9. 2021. Gijón)

Tipo: Aportación congreso