Layer Contour Characterization in Additive Manufacturing Through Image Binarization
- D. Blanco
- A. Fernández
- P. Fernández
- B. Álvarez
- F. Peña
- José Carlos Rico Fernández (ed. lit.)
- Eduardo Cuesta González (ed. lit.)
- Gonzalo Valiño Riestra (ed. lit.)
- Víctor Manuel Meana Díaz (ed. lit.)
- Pedro Fernández Álvares (ed. lit.)
Éditorial: Manufacturing Engineering Society International
ISBN: 9788409292295
Année de publication: 2021
Pages: 110-110
Congreso: Manufacturing Engineering Society International Conference (9. 2021. Gijón)
Type: Communication dans un congrès