Layer Contour Characterization in Additive Manufacturing Through Image Binarization

  1. D. Blanco
  2. A. Fernández
  3. P. Fernández
  4. B. Álvarez
  5. F. Peña
Buch:
Manufacturing Engineering Society International Conference, MESIC 9: Gijόn, 2021, Spain, June 23-24-25
  1. José Carlos Rico Fernández (ed. lit.)
  2. Eduardo Cuesta González (ed. lit.)
  3. Gonzalo Valiño Riestra (ed. lit.)
  4. Víctor Manuel Meana Díaz (ed. lit.)
  5. Pedro Fernández Álvares (ed. lit.)

Verlag: Manufacturing Engineering Society International

ISBN: 9788409292295

Datum der Publikation: 2021

Seiten: 110-110

Kongress: Manufacturing Engineering Society International Conference (9. 2021. Gijón)

Art: Konferenz-Beitrag

DIALNET GOOGLE SCHOLAR lock_openOpen Access editor
Fuente de los datos: Dialnet