Layer Contour Characterization in Additive Manufacturing Through Image Binarization

  1. D. Blanco
  2. A. Fernández
  3. P. Fernández
  4. B. Álvarez
  5. F. Peña
Llibre:
Manufacturing Engineering Society International Conference, MESIC 9: Gijόn, 2021, Spain, June 23-24-25
  1. José Carlos Rico Fernández (ed. lit.)
  2. Eduardo Cuesta González (ed. lit.)
  3. Gonzalo Valiño Riestra (ed. lit.)
  4. Víctor Manuel Meana Díaz (ed. lit.)
  5. Pedro Fernández Álvares (ed. lit.)

Editorial: Manufacturing Engineering Society International

ISBN: 9788409292295

Any de publicació: 2021

Pàgines: 110-110

Congrés: Manufacturing Engineering Society International Conference (9. 2021. Gijón)

Tipus: Aportació congrés