Layer Contour Characterization in Additive Manufacturing Through Image Binarization

  1. D. Blanco
  2. A. Fernández
  3. P. Fernández
  4. B. Álvarez
  5. F. Peña
Liburua:
Manufacturing Engineering Society International Conference, MESIC 9: Gijόn, 2021, Spain, June 23-24-25
  1. José Carlos Rico Fernández (ed. lit.)
  2. Eduardo Cuesta González (ed. lit.)
  3. Gonzalo Valiño Riestra (ed. lit.)
  4. Víctor Manuel Meana Díaz (ed. lit.)
  5. Pedro Fernández Álvares (ed. lit.)

Argitaletxea: Manufacturing Engineering Society International

ISBN: 9788409292295

Argitalpen urtea: 2021

Orrialdeak: 110-110

Biltzarra: Manufacturing Engineering Society International Conference (9. 2021. Gijón)

Mota: Biltzar ekarpena

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Datuen iturria: Dialnet