In-situ waviness characterization of metal plates by a lateral shearing interferometric profilometer

  1. Frade, M.
  2. Enguita, J.M.
  3. Álvarez, I.
Revue:
Sensors (Switzerland)

ISSN: 1424-8220

Année de publication: 2013

Volumen: 13

Número: 4

Pages: 4906-4921

Type: Article

DOI: 10.3390/S130404906 GOOGLE SCHOLAR lock_openAccès ouvert editor

Objectifs de Développement Durable

La source de données: Scopus