In-situ waviness characterization of metal plates by a lateral shearing interferometric profilometer

  1. Frade, M.
  2. Enguita, J.M.
  3. Álvarez, I.
Journal:
Sensors (Switzerland)

ISSN: 1424-8220

Year of publication: 2013

Volume: 13

Issue: 4

Pages: 4906-4921

Type: Article

DOI: 10.3390/S130404906 GOOGLE SCHOLAR lock_openOpen access editor

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