Horiba (France)-ko ikertzaileekin lankidetzan egindako argitalpenak (8)

2012

  1. Analysis of thin and thick Films

    Mass Spectrometry Handbook (John Wiley and Sons), pp. 943-959

2010

  1. Direct chemical in-depth profile analysis and thickness quantification of nanometer multilayers using pulsed-rf-GD-TOFMS

    Analytical and Bioanalytical Chemistry, Vol. 396, Núm. 8, pp. 2881-2887

  2. Polymer screening by radiofrequency glow discharge time-of-flight mass spectrometry

    Analytical and Bioanalytical Chemistry, Vol. 396, Núm. 8, pp. 2863-2869

  3. Quantitative depth profile analysis of boron implanted silicon by pulsed radiofrequency glow discharge time-of-flight mass spectrometry

    Solar Energy Materials and Solar Cells, Vol. 94, Núm. 8, pp. 1352-1357

2009

  1. A comparison of non-pulsed radiofrequency and pulsed radiofrequency glow discharge orthogonal time-of-flight mass spectrometry for analytical purposes

    Journal of Analytical Atomic Spectrometry, Vol. 24, Núm. 10, pp. 1373-1381

  2. Radiofrequency glow discharge time of flight mass spectrometry for thin films analysis: Pulsed mode versus continuous mode

    Yejin Fenxi/Metallurgical Analysis, Vol. 29, Núm. 11, pp. 1-7

  3. Spectroscopic evaluation of a compact magnetically boosted radiofrequency glow discharge for time-of-flight mass spectrometry

    Analytical and Bioanalytical Chemistry, Vol. 394, Núm. 1, pp. 373-382

2008

  1. Pulsed radiofrequency glow discharge time of flight mass spectrometer for the direct analysis of bulk and thin coated glasses

    Journal of Analytical Atomic Spectrometry, Vol. 23, Núm. 9, pp. 1239-1246