JORGE
PISONERO CASTRO
Catedrático de Universidad
Horiba (France)
Longjumeau, FranciaPublikationen in Zusammenarbeit mit Forschern von Horiba (France) (8)
2012
-
Analysis of thin and thick Films
Mass Spectrometry Handbook (John Wiley and Sons), pp. 943-959
2010
-
Direct chemical in-depth profile analysis and thickness quantification of nanometer multilayers using pulsed-rf-GD-TOFMS
Analytical and Bioanalytical Chemistry, Vol. 396, Núm. 8, pp. 2881-2887
-
Polymer screening by radiofrequency glow discharge time-of-flight mass spectrometry
Analytical and Bioanalytical Chemistry, Vol. 396, Núm. 8, pp. 2863-2869
-
Quantitative depth profile analysis of boron implanted silicon by pulsed radiofrequency glow discharge time-of-flight mass spectrometry
Solar Energy Materials and Solar Cells, Vol. 94, Núm. 8, pp. 1352-1357
2009
-
A comparison of non-pulsed radiofrequency and pulsed radiofrequency glow discharge orthogonal time-of-flight mass spectrometry for analytical purposes
Journal of Analytical Atomic Spectrometry, Vol. 24, Núm. 10, pp. 1373-1381
-
Radiofrequency glow discharge time of flight mass spectrometry for thin films analysis: Pulsed mode versus continuous mode
Yejin Fenxi/Metallurgical Analysis, Vol. 29, Núm. 11, pp. 1-7
-
Spectroscopic evaluation of a compact magnetically boosted radiofrequency glow discharge for time-of-flight mass spectrometry
Analytical and Bioanalytical Chemistry, Vol. 394, Núm. 1, pp. 373-382
2008
-
Pulsed radiofrequency glow discharge time of flight mass spectrometer for the direct analysis of bulk and thin coated glasses
Journal of Analytical Atomic Spectrometry, Vol. 23, Núm. 9, pp. 1239-1246