Reliability and Robustness Tests for Next-Generation High-Voltage SiC MOSFETs

  1. Soler, V.
  2. Cabello, M.
  3. Banu, V.
  4. Jorda, X.
  5. Montserrat, J.
  6. Rebollo, J.
  7. Rogina, M.R.
  8. Mihaila, A.
  9. Godignon, P.
Aldizkaria:
IEEE Journal of Emerging and Selected Topics in Power Electronics

ISSN: 2168-6785,  2168-6777

Argitalpen urtea: 2021

Alea: 9

Zenbakia: 4

Orrialdeak: 4320-4329

Mota: Artikulua

DOI: 10.1109/JESTPE.2020.3028159 GOOGLE SCHOLAR
Datuen iturria: Scopus