Fringe pattern characterization by OPD analysis in a lateral shearing interferometric profilometer

  1. Frade, M.
  2. Enguita, J.M.
  3. Álvarez, I.
  4. Rodríguez-Jiménez, S.
Actas:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

ISBN: 9780819486783

Ano de publicación: 2011

Volume: 8082

Tipo: Achega congreso

DOI: 10.1117/12.889267 GOOGLE SCHOLAR

Obxectivos de Desenvolvemento Sustentable

Fonte de datos: Scopus