Fringe pattern characterization by OPD analysis in a lateral shearing interferometric profilometer

  1. Frade, M.
  2. Enguita, J.M.
  3. Álvarez, I.
  4. Rodríguez-Jiménez, S.
Proceedings:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

ISBN: 9780819486783

Year of publication: 2011

Volume: 8082

Type: Conference paper

DOI: 10.1117/12.889267 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus