Toward extended range sub-micron Conoscopic Holography profilometers, using multiple wavelengths and phase measurement

  1. Enguita, J.M.
  2. Álvarez, I.
  3. Marina, J.
  4. Ojea, G.
  5. Cancelas, J.A.
  6. Frade, M.
Proceedings:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

ISBN: 9780819476302

Year of publication: 2009

Volume: 7356

Type: Conference Paper

DOI: 10.1117/12.819456 GOOGLE SCHOLAR
Data source: Scopus