Toward extended range sub-micron Conoscopic Holography profilometers, using multiple wavelengths and phase measurement

  1. Enguita, J.M.
  2. Álvarez, I.
  3. Marina, J.
  4. Ojea, G.
  5. Cancelas, J.A.
  6. Frade, M.
Actes de conférence:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

ISBN: 9780819476302

Année de publication: 2009

Volumen: 7356

Type: Communication dans un congrès

DOI: 10.1117/12.819456 GOOGLE SCHOLAR

Objectifs de Développement Durable