Toward extended range sub-micron Conoscopic Holography profilometers, using multiple wavelengths and phase measurement
- Enguita, J.M.
- Álvarez, I.
- Marina, J.
- Ojea, G.
- Cancelas, J.A.
- Frade, M.
ISSN: 0277-786X
ISBN: 9780819476302
Ano de publicación: 2009
Volume: 7356
Tipo: Achega congreso