Toward extended range sub-micron Conoscopic Holography profilometers, using multiple wavelengths and phase measurement

  1. Enguita, J.M.
  2. Álvarez, I.
  3. Marina, J.
  4. Ojea, G.
  5. Cancelas, J.A.
  6. Frade, M.
Actas:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

ISBN: 9780819476302

Ano de publicación: 2009

Volume: 7356

Tipo: Achega congreso

DOI: 10.1117/12.819456 GOOGLE SCHOLAR

Obxectivos de Desenvolvemento Sustentable