JUAN RAMON
GARCIA MERE
Investigador
ALEXIS ANSELMO
GOMEZ GOMEZ
Investigador
Publicacions en què col·labora amb ALEXIS ANSELMO GOMEZ GOMEZ (5)
2024
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A Physics-Oriented Analysis of SiC Trench MOSFETs Under Gate Switching Stress Test Conditions
Proceedings of the International Symposium on Power Semiconductor Devices and ICs
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Aging Modeling and Simulation of the Gate Switching Instability Degradation in SiC MOSFETs
Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
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Aging Modeling and Simulation of the Gate Switching Instability Degradation in SiC MOSFETs
2024 IEEE Applied Power Electronics Conference and Exposition (APEC)
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Deep Investigation on SiC MOSFET Degradation under Gate Switching Stress and Application Switching Stress
Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
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Deep Investigation on SiC MOSFET Degradation under Gate Switching Stress and Application Switching Stress
2024 IEEE Applied Power Electronics Conference and Exposition (APEC)