GRUPO DE NANOCIENCIA
UONANO
Elvira
Vieira
Elvira Vieira-rekin lankidetzan egindako argitalpenak (8)
2017
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SiGe layer thickness effect on the structural and optical properties of well-organized SiGe/SiO2 multilayers
Nanotechnology, Vol. 28, Núm. 34
2014
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IBA study of SiGe/SiO2 nanostructured multilayers
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 331, pp. 89-92
2013
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Influence of RF-sputtering power on formation of vertically stacked Si
1-x
Ge
x
nanocrystals between ultra-thin amorphous Al
2
O
3
layers: Structural and photoluminescence properties
Journal of Physics D: Applied Physics, Vol. 46, Núm. 38
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A shadowed off-axis production of Ge nanoparticles in Ar gas atmosphere by pulsed laser deposition
Applied Physics A: Materials Science and Processing, Vol. 110, Núm. 3, pp. 585-590
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Charge trapping properties and retention time in amorphous SiGe/SiO 2 nanolayers
Journal of Physics D: Applied Physics, Vol. 46, Núm. 9
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Shadowed off-axis production of Ge nanoparticles in Ar gas atmosphere by pulsed laser deposition: Morphological, structural and charge trapping properties
Applied Surface Science, Vol. 280, pp. 632-640
2012
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Ge nanocrystals with highly uniform size distribution deposited on alumina at room temperature by pulsed laser deposition: Structural, morphological, and charge trapping properties
Journal of Nanoparticle Research, Vol. 14, Núm. 5
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Structural and electrical studies of ultrathin layers with Si 0.7Ge 0.3 nanocrystals confined in a SiGe/SiO 2 superlattice
Journal of Applied Physics