Exploring deep fully convolutional neural networks for surface defect detection in complex geometries

  1. García Peña, D.
  2. García Pérez, D.
  3. Díaz Blanco, I.
  4. Juárez, J.M.
Revue:
International Journal of Advanced Manufacturing Technology

ISSN: 1433-3015,  0268-3768

Année de publication: 2024

Volumen: 134

Número: 1-2

Pages: 97-111

Type: Article

DOI: 10.1007/S00170-024-14069-7 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus