Exploring deep fully convolutional neural networks for surface defect detection in complex geometries

  1. García Peña, D.
  2. García Pérez, D.
  3. Díaz Blanco, I.
  4. Juárez, J.M.
Aldizkaria:
International Journal of Advanced Manufacturing Technology

ISSN: 1433-3015,  0268-3768

Argitalpen urtea: 2024

Alea: 134

Zenbakia: 1-2

Orrialdeak: 97-111

Mota: Artikulua

DOI: 10.1007/S00170-024-14069-7 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus