Metal-insulator transition in crystalline V2O3 thin films probed at atomic-scale using emission Mössbauer spectroscopy

  1. Qi, B.
  2. Gunnlaugsson, H.P.
  3. Ólafsson, S.
  4. Gislason, H.P.
  5. Thorsteinsson, E.B.
  6. Arnalds, U.B.
  7. Mantovan, R.
  8. Unzueta l, I.
  9. Zyabkin, D.V.
  10. Ram, K.B.
  11. Johnston, K.
  12. Krastev, P.B.
  13. Mølholt, T.E.
  14. Masenda, H.
  15. Martín-Luengo, A.T.
  16. Naidoo, D.
  17. Schell, J.
Revista:
Thin Solid Films

ISSN: 0040-6090

Ano de publicación: 2020

Volume: 714

Tipo: Artigo

DOI: 10.1016/J.TSF.2020.138389 GOOGLE SCHOLAR