Metal-insulator transition in crystalline V2O3 thin films probed at atomic-scale using emission Mössbauer spectroscopy

  1. Qi, B.
  2. Gunnlaugsson, H.P.
  3. Ólafsson, S.
  4. Gislason, H.P.
  5. Thorsteinsson, E.B.
  6. Arnalds, U.B.
  7. Mantovan, R.
  8. Unzueta l, I.
  9. Zyabkin, D.V.
  10. Ram, K.B.
  11. Johnston, K.
  12. Krastev, P.B.
  13. Mølholt, T.E.
  14. Masenda, H.
  15. Martín-Luengo, A.T.
  16. Naidoo, D.
  17. Schell, J.
Aldizkaria:
Thin Solid Films

ISSN: 0040-6090

Argitalpen urtea: 2020

Alea: 714

Mota: Artikulua

DOI: 10.1016/J.TSF.2020.138389 GOOGLE SCHOLAR