Metal-insulator transition in crystalline V2O3 thin films probed at atomic-scale using emission Mössbauer spectroscopy

  1. Qi, B.
  2. Gunnlaugsson, H.P.
  3. Ólafsson, S.
  4. Gislason, H.P.
  5. Thorsteinsson, E.B.
  6. Arnalds, U.B.
  7. Mantovan, R.
  8. Unzueta l, I.
  9. Zyabkin, D.V.
  10. Ram, K.B.
  11. Johnston, K.
  12. Krastev, P.B.
  13. Mølholt, T.E.
  14. Masenda, H.
  15. Martín-Luengo, A.T.
  16. Naidoo, D.
  17. Schell, J.
Revista:
Thin Solid Films

ISSN: 0040-6090

Any de publicació: 2020

Volum: 714

Tipus: Article

DOI: 10.1016/J.TSF.2020.138389 GOOGLE SCHOLAR