Metal-insulator transition in crystalline V2O3 thin films probed at atomic-scale using emission Mössbauer spectroscopy
- Qi, B.
- Gunnlaugsson, H.P.
- Ólafsson, S.
- Gislason, H.P.
- Thorsteinsson, E.B.
- Arnalds, U.B.
- Mantovan, R.
- Unzueta l, I.
- Zyabkin, D.V.
- Ram, K.B.
- Johnston, K.
- Krastev, P.B.
- Mølholt, T.E.
- Masenda, H.
- Martín-Luengo, A.T.
- Naidoo, D.
- Schell, J.
Revista:
Thin Solid Films
ISSN: 0040-6090
Any de publicació: 2020
Volum: 714
Tipus: Article