Characteristic jump in the electrical properties of a Pd/AlN/Si -based device on exposure to hydrogen
- Thakur, J.S.
- Prakasam, H.E.
- Zhang, L.
- McCullen, E.F.
- Rimai, L.
- García-Suárez, V.M.
- Naik, R.
- Ng, K.Y.S.
- Auner, G.W.
ISSN: 1098-0121, 1550-235X
Argitalpen urtea: 2007
Alea: 75
Zenbakia: 7
Mota: Artikulua