Capabilities of femtosecond laser ablation inductively coupled plasma mass spectrometry for depth profiling of thin metal coatings

  1. Pisonero, J.
  2. Koch, J.
  3. Wälle, M.
  4. Hartung, W.
  5. Spencer, N.D.
  6. Günther, D.
Revue:
Analytical Chemistry

ISSN: 0003-2700

Année de publication: 2007

Volumen: 79

Número: 6

Pages: 2325-2333

Type: Article

DOI: 10.1021/AC062027S GOOGLE SCHOLAR

Objectifs de Développement Durable