Paving the Way for Suitable Metasurfaces' Measurements under Oblique Incidence: Mono-/Bistatic and Near-/Far-Field Concerns

  1. Alvarez, H.F.
  2. Gomez, M.E.D.C.
  3. Las-Heras, F.
Revista:
IEEE Transactions on Instrumentation and Measurement

ISSN: 1557-9662 0018-9456

Ano de publicación: 2020

Volume: 69

Número: 4

Páxinas: 1737-1744

Tipo: Artigo

DOI: 10.1109/TIM.2019.2913721 GOOGLE SCHOLAR