Paving the Way for Suitable Metasurfaces' Measurements under Oblique Incidence: Mono-/Bistatic and Near-/Far-Field Concerns

  1. Alvarez, H.F.
  2. Gomez, M.E.D.C.
  3. Las-Heras, F.
Revue:
IEEE Transactions on Instrumentation and Measurement

ISSN: 1557-9662,  0018-9456

Année de publication: 2020

Volumen: 69

Número: 4

Pages: 1737-1744

Type: Article

DOI: 10.1109/TIM.2019.2913721 GOOGLE SCHOLAR
La source de données: Scopus