Analytical potential of rf-PGD-TOFMS for depth profiling of an oxidized thin film composite

  1. González-Gago, C.
  2. Pisonero, J.
  3. Sandín, R.
  4. Fuertes, J.F.
  5. Sanz-Medel, A.
  6. Bordel, N.
Revue:
Journal of Analytical Atomic Spectrometry

ISSN: 1364-5544,  0267-9477

Année de publication: 2016

Volumen: 31

Número: 1

Pages: 288-296

Type: Article

DOI: 10.1039/C5JA00104H GOOGLE SCHOLAR
La source de données: Scopus