Imaging techniques and scanning electron microscopy as tools for characterizing a Si-based material used in air monitoring applications

  1. Suárez-Peña, B.
  2. Negral, L.
  3. Castrillón, L.
  4. Megido, L.
  5. Marañón, E.
  6. Fernández-Nava, Y.
Revue:
Materials

ISSN: 1996-1944

Année de publication: 2016

Volumen: 9

Número: 2

Type: Article

DOI: 10.3390/MA9020109 GOOGLE SCHOLAR lock_openAccès ouvert editor

Objectifs de Développement Durable

La source de données: Scopus