Imaging techniques and scanning electron microscopy as tools for characterizing a Si-based material used in air monitoring applications

  1. Suárez-Peña, B.
  2. Negral, L.
  3. Castrillón, L.
  4. Megido, L.
  5. Marañón, E.
  6. Fernández-Nava, Y.
Aldizkaria:
Materials

ISSN: 1996-1944

Argitalpen urtea: 2016

Alea: 9

Zenbakia: 2

Mota: Artikulua

DOI: 10.3390/MA9020109 GOOGLE SCHOLAR lock_openSarbide irekia editor

Garapen Iraunkorreko Helburuak

Datuen iturria: Scopus