High accuracy reflectometry technique and statistical measurements treatment method for refraction index determination
- Ayuso, D.F.P.
- Granda, M.G.
- Fernández, S.F.
- García, J.R.
Actas:
Proceedings of SPIE - The International Society for Optical Engineering
ISSN: 0277-786X
Ano de publicación: 2005
Volume: 5858
Páxinas: 1-10
Tipo: Achega congreso