High accuracy reflectometry technique and statistical measurements treatment method for refraction index determination

  1. Ayuso, D.F.P.
  2. Granda, M.G.
  3. Fernández, S.F.
  4. García, J.R.
Actes de conférence:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

Année de publication: 2005

Volumen: 5858

Pages: 1-10

Type: Communication dans un congrès

DOI: 10.1117/12.612116 GOOGLE SCHOLAR
La source de données: Scopus