Flatness measurement system based on a non-linear optical triangulation technique
- Garcia, Daniel F.
- Garcia, Manuel
- Obeso, Faustino
- Fernandez, Valentin
Actas:
Conference Record - IEEE Instrumentation and Measurement Technology Conference
Ano de publicación: 2000
Volume: 3
Páxinas: 1297-1302
Tipo: Achega congreso