Flatness measurement system based on a non-linear optical triangulation technique

  1. Garcia, Daniel F.
  2. Garcia, Manuel
  3. Obeso, Faustino
  4. Fernandez, Valentin
Actas:
Conference Record - IEEE Instrumentation and Measurement Technology Conference

Ano de publicación: 2000

Volume: 3

Páxinas: 1297-1302

Tipo: Achega congreso