Flatness defect measurement system for steel industry based on a real-time linear-image processor

  1. Garcia, Daniel F.
  2. del Rio, Marcos A.
  3. Diaz, Jose L.
  4. Suarez, Francisco J.
Proceedings:
Proceedings of the IEEE International Conference on Systems, Man and Cybernetics

ISSN: 0884-3627

ISBN: 0780309111

Year of publication: 1993

Volume: 3

Pages: 331-336

Type: Conference paper

GOOGLE SCHOLAR
Data source: Scopus