RAMON
TORRECILLAS SAN MILLAN
Investigador/a
STMicroelectronics
Ginebra, SuizaSTMicroelectronics-ko ikertzaileekin lankidetzan egindako argitalpenak (1)
2014
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SEM-based system for 100nm x-ray tomography for the analysis of porous silicon
DEVELOPMENTS IN X-RAY TOMOGRAPHY IX