MARIA
RODRIGUEZ ROGINA
Investigador/a
Instituto de Microelectrónica de Barcelona
Barcelona, EspañaInstituto de Microelectrónica de Barcelona -ko ikertzaileekin lankidetzan egindako argitalpenak (1)
2021
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Reliability and Robustness Tests for Next-Generation High-Voltage SiC MOSFETs
IEEE Journal of Emerging and Selected Topics in Power Electronics, Vol. 9, Núm. 4, pp. 4320-4329