ALEJANDRO FERNANDEZ SUAREZ-rekin lankidetzan egindako argitalpenak (3)

2024

  1. Layer Contour Geometric Characterization in MEX/P through CIS-Based Adaptive Edge Detection

    Applied Sciences (Switzerland), Vol. 14, Núm. 14

  2. On-Machine LTS Integration for Layer-Wise Surface Quality Characterization in MEX/P

    Sensors, Vol. 24, Núm. 11

2022

  1. Conoscopic Holography feasibility for form error in-situ monitoring in Additive Manufacturing

    IFAC-PapersOnLine