On-Machine LTS Integration for Layer-Wise Surface Quality Characterization in MEX/P

  1. Fernández, A.
  2. Zapico, P.
  3. Blanco, D.
  4. Peña, F.
  5. Beltrán, N.
  6. Mateos, S.
Journal:
Sensors

ISSN: 1424-8220

Year of publication: 2024

Volume: 24

Issue: 11

Type: Article

DOI: 10.3390/S24113459 GOOGLE SCHOLAR lock_openOpen access editor

Sustainable development goals

Data source: Scopus