CARLOS
QUIROS FERNANDEZ
Catedrático de Universidad
Instituto de Ciencia de Materiales de Madrid
Madrid, EspañaPublicaciones en colaboración con investigadores/as de Instituto de Ciencia de Materiales de Madrid (8)
2002
2001
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Electronic interaction at the TiO2-Al2O3 interface as observed by X-ray absorption spectroscopy
Surface Science
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Resonant photoemission and X-ray absorption study of electronic structure of the TiO2-Al2O3 interface
Langmuir, Vol. 17, Núm. 23, pp. 7339-7343
2000
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Correlation between N1 s core level x-ray photoelectron and x-ray absorption spectra of amorphous carbon nitride films
Applied Physics Letters, Vol. 77, Núm. 6, pp. 803-805
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Determination of resputtering yields in carbon nitride films grown by dual ion beam sputtering
Surface and Coatings Technology, Vol. 125, Núm. 1-3, pp. 366-370
1999
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Combination of specular and off-specular low-angle X-ray diffraction in the study of Co/Cu multilayers: Mesoscopic structure and layer oxidation
Surface and Interface Analysis, Vol. 27, Núm. 1, pp. 1-7
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Oxidation study of Co/Cu multilayers by resonant X-ray reflectivity
Vacuum, Vol. 52, Núm. 1-2, pp. 109-113
1998
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Combination of specular and off-specular low-angle X-ray diffraction in the study of metallic multilayers
Solid State Communications, Vol. 108, Núm. 10, pp. 769-773