JAVIER IGNACIO
DIAZ FERNANDEZ
Profesor Titular de Universidad
IBM Research – Almaden
San Jose, EE. UU.Publications en collaboration avec des chercheurs de IBM Research – Almaden (6)
1999
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Enhanced secondary electron yield from oxidized regions on amorphous carbon films studied by x-ray spectromicroscopy
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 17, Núm. 5, pp. 2737-2740
1998
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Microscopic origin of liquid crystal alignment on rubbed polymer surfaces
Macromolecules, Vol. 31, Núm. 6, pp. 1942-1946
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X-PEEM study on surface orientation of stylized and rubbed polyimides
Macromolecules, Vol. 31, Núm. 15, pp. 4957-4962
1997
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An x-ray spectromicroscopic study of the local structure of patterned titanium suicide
Applied Physics Letters, Vol. 71, Núm. 1, pp. 55-57
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Photoelectron emission microscopy and its application to the study of polymer surfaces
Acta Physica Polonica A, Vol. 91, Núm. 5, pp. 923-927
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Surface relaxations in polymers
Macromolecules, Vol. 30, Núm. 25, pp. 7768-7771