Publicaciones en colaboración con investigadores/as de Universidad de Sevilla (3)

1999

  1. Dielectric properties of Ti, TiO2 and TiN from 1.5 to 60 eV determined by reflection electron energy loss spectroscopy (REELS) and ellipsometry

    Physica Status Solidi (A) Applied Research, Vol. 175, Núm. 1, pp. 429-436

  2. Tribological and chemical characterization of ion beam-deposited CNx films

    Vacuum, Vol. 52, Núm. 1-2, pp. 199-202

1996

  1. Characterization of carbon nitride thin films prepared by dual ion beam sputtering

    Applied Physics Letters, Vol. 69, Núm. 6, pp. 764-766